A new instrument for state-of-the-art X-ray scattering measurements has been installed in the LRSM in the newly renovated room 13. The Xeuss 2.0 by XENOCS has a Cu and Mo X-ray sources, computer controlled focusing, transmission and grazing incident sample geometries, a 1M pixel Pilatus detector (2D), a smaller detector for simultaneous SAXS and WAXS, and a variety of in situ capabilities.
The facility will be called DEXS: Dual Source and Environmental X-ray Scattering.
An application scientist from XENOCS will present a morning of talks about X-ray scattering in general and the new instrument.
The lectures start with an introduction to the basics of the physics of x-ray interactions with materials and the need of a non-destructive atomic and molecular structure probe. Then, a basic review of x-ray production and optics for scattering experiments will be presented. It will be followed by a how-to introduction to sample environments and data acquisition and reduction. Ending with a brief introduction to data analysis and interpretation.